Modeling and Integration of Non-Linear Optics with Si Using Epitaxial Oxides

IRES @ IBM Zürich

Research
Location
People
Photos

• .

Objectives

A joint research study of the electro-optical properties of BaTiO₃ (BTO) films grown on Si by the group at The University of Texas at Austin and the group at IBM Zürich.
Student participants in this project have the opportunity to work on the full process flow, from materials growth to device characerization to modeling.

PUBLICATIONS PRODUCED AS A RESULT OF THIS RESEARCH

1. K. J. Kormondy, S. Abel, F. Fallegger, Y. Popoff, P. Ponath, A. B. Posadas, M. Sousa, D. Caimi, H. Siegwart, E. Uccelli, L. Czornomaz, C. Marchiori, J. Fompeyrine, and A. A. Demkov, "Analysis of the Pockels effect in ferroelectric barium titanate thin films on Si(001)," Microelectron. Eng. 147, 215–218 (2015). Available Online
2. K. D. Fredrickson, C. Lin, S. Zollner, and A. A. Demkov, "Theoretical study of negative optical mode splitting in LaAlO3," Phys. Rev. B 93, 134301 (2016). Available Online
3. K. J. Kormondy, Y. Popoff, M. Sousa, F. Eltes, D. Caimi, M. D. Rossell, M. Fiebig, P. Hoffmann, C. Marchiori, M. Reinke, M. Trassin, A. A. Demkov, J. Fompeyrine, and S. Abel, "Microstructure and ferroelectricity of BaTiO 3 thin films on Si for integrated photonics," Nanotechnology 28, 75706 (2017). Available Online
4. K. D. Fredrickson, V. Volger-Neuling, K. J. Kormondy, S. Abel, J. Fompeyrine, and A. A. Demkov, "Enormous electro-optical response in Si-integrated thin strained BaTiO₃ films," in preparation.

Research Areas

1. Thin-film deposition and materials characterization.

   .

2. Processing and device fabrication.

   .

3. Electro-optic characterization.

   .

4. Active devices.

   .

   

5. First-principles calculations.

   .

Links:

• Advanced Atomic Design Lab at The University of Texas at Austin Department of Physics
• Materials Integration & Nanoscale Devices (MIND) group at IBM ZRL